Abstract
The potentialities of pulse-amplitude analysis for noise measurements are demonstrated with p +-n silicon detectors. It is suggested to use the detector current as a parameter and vary it by illuminating the samples. The instrument was calibrated by the shot noise of the photocurrent. The criteria for shot noise are the linearity of the noise squared vs. current dependence and its slope. It is shown that conventional instrumentation for pulse-amplitude analysis provides accurate yet rapid noise investigation. For the detectors studied, flicker noise was absent even when the trapped charge in the field oxide increases by one order of magnitude.
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Translated from Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 70, No. 2, 2000, pp. 139–142.
Original Russian Text Copyright © 2000 by Ivanov, Strokan.
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Ivanov, A.M., Strokan, N.B. The investigation of noise in hard radiation detectors by pulse-amplitude analysis. Tech. Phys. 45, 281–284 (2000). https://doi.org/10.1134/1.1259614
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DOI: https://doi.org/10.1134/1.1259614