Abstract
The residual stresses in samples of polycrystalline ZnSe are studied by measuring the photoelasticity in the visible part of the spectrum with transillumination parallel and perpendicular to the growth axis. The thermal and growth components of the birefringence, which exhibit different types of distributions among samples, are investigated. It is established that the thermal component has a nearly equilibrium distribution, while the growth component has an asymmetric distribution, which reflects individual features in the growth of each specific sample.
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Zh. Tekh. Fiz. 68, 85–90 (June 1998)
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Andrianova, L.K., Afanas’ev, I.I. & Dunaev, A.A. Postgrowth residual stresses in polycrystalline zinc selenide. Tech. Phys. 43, 691–695 (1998). https://doi.org/10.1134/1.1259055
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DOI: https://doi.org/10.1134/1.1259055