Abstract
A new theoretical model is proposed to describe the behavior of films of composite hydrogen-containing compounds during heat treatment. The model is based on the thermal generation of hydrogen atoms and atoms of the composite compounds with their subsequent diffusion to the boundaries of the film and percolation through the surface into the atmosphere. Calculations are performed for the heat treatment of films of silicon nitride. A comparison with the experimental data in the literature demonstrates the high efficiency of the proposed model.
Similar content being viewed by others
References
Z. L. Akkerman, N. I. Fainer, and M. L. Kosinova et al., in Proceedings of SPIE, the International Society of Optical Engineering, 1992, Vol. 1783, 530.
Z. L. Akkerman, M. L. Kosinova, and N. I. Fainer et al., Thin Solid Films 260, 156 (1995).
O. V. Polyakov and M. V. Badalian, Phys. Status Solidi B 185, K1 (1994).
A. V. Rzhanov, Silicon Nitride in Electronics [in Russian], Nauka, Novosibirsk (1982).
Z. L. Akkerman, L. V. Khramova, and T. P. Smirnova et al., Neorg. Mater. 26, 988 (1990).
Z. L. Akkerman, L. V. Khramova, and T. P. Smirnova et al., Neorg. Mater. 26, 993 (1990).
L. V. Chramova, T. P. Chusova, and G. A. Kokovin, Thin Solid Films 147, 267 (1987).
V. A. Gritsenko, Structure and Electronic Structure of Amorphous Insulators in Silicon MIS Structures [in Russian], Nauka, Novosibirsk (1993).
J. Robertson, Philos. Mag. B 69, 307 (1994).
W. L. Warren, J. Robertson, and J. Kanicki, Appl. Phys. Lett., 63, 2685 (1993).
G. V. Gadiyak, Fiz. Tekh. Poluprovodn. 31, 257 (1997) [Semiconductors 31, 207 (1997)].
V. G. Litovchenko and A. P. Gorban’, Principles of the Physics of Metal-Insulator-Semiconductor Micro-Electronic Systems [in Russian], Naukova Dumka, Kiev (1978).
H. J. Stein, Mat. Res. Soc. Symp. Proc., Vol. 59, 523 (1986).
G. A. Kachurin and I. E. Tyschenko, Mikroélektronika 23(6), 3 (1994).
B. E. Deal and A. S. Grove, J. Appl. Phys. 36, 3770 (1965).
L. V. Khramova, T. P. Chusova, and V. A. Gritsenko et al., Elektron. Tekh. Ser. 6, Mater. 1, 10 (1984).
Author information
Authors and Affiliations
Additional information
Zh. Tekh. Fiz. 67, 105–110 (August 1997)
Rights and permissions
About this article
Cite this article
Gadiyak, G.V., Gadiyak, V.G., Kosinova, M.L. et al. Theoretical model for describing degradation of thin hydrogen-containing films. Tech. Phys. 42, 950–955 (1997). https://doi.org/10.1134/1.1258760
Received:
Issue Date:
DOI: https://doi.org/10.1134/1.1258760