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Effect of electric current on starting characteristics and activation parameters of short dislocations in Si crystals

  • Defects, Dislocations, and Physics of Strength
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Abstract

It is shown that the passage of an electric current through crystalline silicon may lead to the so-called galvanoplasticization, as well as the galvanostrengthening, effect. It is found that the effect is sensitive to the temperature regime of deforming and to the preliminary high-temperature treatment of the samples. The motion delay time for short dislocations and starting stresses are significantly affected by the current. The relation of these effects to the change in the electric state of the Cottrell atmosphere as a result of the passage of the current through the crystal is considered.

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References

  1. Yu. A. Osip’yan and V. F. Petrenko, in Physics of A II B IV Compounds (Mir, Moscow, 1986), p. 35.

    Google Scholar 

  2. N. Maeda, K. Kimura, and S. Takeuchi, Izv. Akad. Nauk SSSR, Ser. Fiz. 51(4), 729 (1987).

    Google Scholar 

  3. T. Suzuki, H. Yoshinaga, and S. Takeuchi, Dislocation Dynamics and Plasticity (Syokabo, Tokyo, 1986; Mir, Moscow, 1989).

    Google Scholar 

  4. V. A. Makara, L. P. Steblenko, and E. G. Robur, Solid State Phenom. 32–33, 619 (1993).

    Google Scholar 

  5. V. V. Lemeshko, V. A. Makara, V. V. Obukhovskii, et al., Fiz. Tverd. Tela 36(9), 2618 (1994) [Phys. Solid State 36, 1427 (1994)].

    Google Scholar 

  6. V. A. Makara, L. P. Steblenko, N. Ya. Gorid’ko, et al., Dopovidi Akad. Nauk Ukr., No. 3, 78 (1994).

  7. M. A. Aliev, Kh. O. Alieva, and V. V. Seleznev, Fiz. Tverd. Tela 37(12), 3732 (1995) [Phys. Solid State 37, 2057 (1995)].

    Google Scholar 

  8. N. Ya. Gorid’ko, V. A. Makara, N. N. Novikov, et al., Fiz. Tverd. Tela 25(9), 2598 (1983) [Sov. Phys. Solid State 25, 1494 (1983)].

    Google Scholar 

  9. V. A. Makara, N. N. Novikov, L. P. Steblenko, et al., Fiz. Tverd. Tela 31(5), 31 (1989) [Sov. Phys. Solid State 31, 738 (1989)].

    Google Scholar 

  10. V. S. Vavilov, V. F. Kiselev, and B. N. Mukashev, Defects in the Bulk of Silicon and on Its Surface (Nauka, Moscow, 1990).

    Google Scholar 

  11. K. Ravi, Imperfections and Impurities in Semiconductor Silicon (Wiley, New York, 1981; Mir, Moscow, 1984).

    Google Scholar 

  12. H. van Bueren, Imperfections in Crystals (Amsterdam, 1960; Foreign Languages Publ. House, Moscow, 1962).

  13. B. V. Petukhov, Fiz. Metal. Metalloved. 56(6), 1177 (1983).

    Google Scholar 

  14. J. Hirth and J. Lothe, Theory of Dislocations (McGraw-Hill, New York, 1968; Atomizdat, Moscow, 1972).

    Google Scholar 

  15. V. A. Makara, Preprint No. IMP-86-2 of IES (Paton Institute of Welding), Kiev (1986).

  16. H. Matare, Defect Electronics in Semiconductors (Wiley, New York, 1971; Mir, Moscow, 1974).

    Google Scholar 

  17. I. E. Bondarenko and E. B. Yakimov, Phys. Status Solidi A 122(1), 121 (1990).

    Google Scholar 

  18. F. Shimura, Electrochem. Soc. 128, 1579 (1981).

    Google Scholar 

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Translated from Fizika Tverdogo Tela, Vol. 42, No. 5, 2000, pp. 854–858.

Original Russian Text Copyright © 2000 by Makara, Steblenko, Obukhovski\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\), Gorid’ko, Lemeshko.

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Makara, V.A., Steblenko, L.P., Obukhovskii, V.V. et al. Effect of electric current on starting characteristics and activation parameters of short dislocations in Si crystals. Phys. Solid State 42, 877–881 (2000). https://doi.org/10.1134/1.1131305

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  • DOI: https://doi.org/10.1134/1.1131305

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