Skip to main content
SpringerLink
Log in

Determining the microhardness throughout the depth in a sample

  • Defects. Dislocations. Physics of Strength
  • Published:
Physics of the Solid State Aims and scope Submit manuscript

Abstract

In order to improve the accuracy of the microindentation mechanism, experimental data on the influence of the spectral composition and intensity of light on the microhardness of single-crystal Si and theoretical calculations have been analyzed to establish that a thin layer of high hardness exists near the surface of Si. This layer has a different influence on the microhardness, depending upon how deeply the indenter penetrates into the substance.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. G. C. Kuczynsky and R. H. Hochman, Phys. Rev. 108, 946 (1957).

    ADS  Google Scholar 

  2. P. P. Kuz’menko, N. N. Novikov, N. R. Gorid’ko, and L. I. Fedorenko, Fiz. Tverd. Tela 8, 1732 (1966) [Sov. Phys. Solid State 8, 1381 (1966)].

    Google Scholar 

  3. V. M. Glazov and V. N. Vigdorovich, Microhardness of Metals and Semiconductors [in Russian] (Metallurgiya, Moscow, 1969).

    Google Scholar 

  4. V. K. Grigorovich, in Test Methods for Microhardness [in Russian] (Nauka, Moscow, 1965), p. 35.

    Google Scholar 

  5. V. I. Kruglov, Uch. Zap. Leningr. Gos. Univ. No. 386, 119 (1976).

  6. V. P. Alekhin “Physical regularities of microplastic deformation of the damage of the surface layers of a solid” Author’s abstract of dissertation, Kiev, 1978.

  7. Yu. S. Boyarskaya and M. I. Val’kovskaya, Microhardness [in Russian] (Shtiintsa, Kishinev, 1981), p. 67.

    Google Scholar 

  8. P. D. Uoren, S. G. Roberts, and P. B. Khirsh, Izv. Akad. Nauk SSSR, Ser. Fiz. 51, 812 (1987).

    Google Scholar 

  9. A. B. Gerasimov, Z. V. Dzhibuti, and G. D. Chiradze, Soobshch. Akad. Nauk Gruzii 142, No. 1, 53 (1991).

    Google Scholar 

  10. A. B. Gerasimov and G. D. Chiradze, Soobshch. Akad. Nauk Gruzii 142, No. 1, 61 (1991).

    Google Scholar 

  11. Yu. I. Golovin and A. I. Tyurin, Fiz. Tverd. Tela 37, 1562 (1995) [Phys. Solid State 37, 849 (1995)].

    Google Scholar 

  12. A. B. Gerasimov, G. D. Chiradze, N. G. Kutivadze, A. P. Bibilashvili, and Z. G. Bokhochadze, Fiz. Tverd. Tela 40, 503 (1998) [Phys. Solid State 40, 462 (1998)].

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Tbilisi State University, 380028, Tbilisi, Georgia

    A. B. Gerasimov, G. D. Chiradze, N. G. Kutivadze, A. P. Bibilashvili & Z. G. Bokhochadze

Authors
  1. A. B. Gerasimov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. G. D. Chiradze
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. N. G. Kutivadze
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. A. P. Bibilashvili
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Z. G. Bokhochadze
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Fiz. Tverd. Tela (St. Petersburg) 41, 1225–1227 (July 1999)

Rights and permissions

Reprints and permissions

About this article

Cite this article

Gerasimov, A.B., Chiradze, G.D., Kutivadze, N.G. et al. Determining the microhardness throughout the depth in a sample. Phys. Solid State 41, 1115–1117 (1999). https://doi.org/10.1134/1.1130949

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1134/1.1130949

Keywords

Search

Navigation