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Glass Physics and Chemistry

, Volume 37, Issue 6, pp 590–595 | Cite as

Investigation of the formation of fractal structures in SiO2 · SnO x · CuO y thin films prepared by the sol-gel method

  • N. K. Plugotarenko
  • V. V. PetrovEmail author
  • V. A. Ivanetz
  • V. A. Smirnov
Proceedings of the First All-Russian Conference “Sol-Gel Synthesis and Study of Inorganic Compounds, Hybrid Functional Materials, and Disperse Systems” (St. Petersburg, Russia, November 22–24, 2010)

Abstract

The processes of fractal structure formation have been considered in SiO2 · SnO x · CuO y nanofilms prepared by the sol-gel method from a tetraethoxysilane alchohol solution modified by metal salts. The atomic force microscopy images of these films have been obtained. The surface morphology has been analyzed using the Takens embedding method and Grassberger-Procaccia algorithm. The correlation and fractal dimensions of the film samples and the coefficient of surface area increase have been calculated. The effects of the annealing temperature and concentration of the doping component on the formation of fractal structures in the materials under study have been estimated.

Keywords

fractal structure thin film nanomaterial surface morphology correlation dimension 

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Copyright information

© Pleiades Publishing, Ltd. 2011

Authors and Affiliations

  • N. K. Plugotarenko
    • 1
  • V. V. Petrov
    • 1
    Email author
  • V. A. Ivanetz
    • 1
  • V. A. Smirnov
    • 1
  1. 1.Taganrog Institute of TechnologySouthern Federal UniversityTaganrogRussia

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