Technical Physics Letters

, Volume 40, Issue 12, pp 1117–1120 | Cite as

Analysis of stacking faults in gallium nitride by Fourier transform of high-resolution images

  • D. A. Kirilenko
  • A. A. Sitnikova
  • A. V. Kremleva
  • M. G. Mynbaeva
  • V. I. Nikolaev
Article

Abstract

We present results of studying stacking faults (SFs) in gallium nitride (GaN) with the aid of Fourier transform of high-resolution transmission electron microscopy (HRTEM) images. Using this method, it is possible both to determine the SF type and to directly measure the corresponding displacement vector. This allowed us to explain the peculiarities of the contrast of HRTEM of structures with high SF density (above 106 cm−1). It is established that the displacement vector component in the (0001) plane in these structures can significantly differ from the expected value of \((1/3)[00\bar 10]\) that is typical of single SFs.

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References

  1. 1.
    F. Wu, Y.-D. Lin, A. Chakraborty, et al., Appl. Phys. Lett. 96, 231912 (2010).ADSCrossRefGoogle Scholar
  2. 2.
    A. M. Fischer, Z. Wu, K. Sun, Q. Wei, Y. Huang, R. Senda, D. Iida, M. Iwaya, H. Amano, and F. A. Ponce, Appl. Phys. Express 2, 041002 (2009).ADSCrossRefGoogle Scholar
  3. 3.
    D. N. Zakharov, Z. Liliental-Weber, B. Wagner, et al., Phys. Rev. B 71, 235334 (2005).ADSCrossRefGoogle Scholar
  4. 4.
    J. Kuang and W. Cao, Appl. Phys. Lett. 103, 112906 (2013).ADSCrossRefGoogle Scholar
  5. 5.
    M. J. Hÿtch, E. Snoeck, and R. Kilaas, Ultramicroscopy 74(3), 136 (1998).CrossRefGoogle Scholar
  6. 6.
    V. Nikolaev, A. Golovatenko, M. Mynbaeva, I. Nikitina, N. Seredova, A. Pechnikov, V. Bougrov, and M. Odnobludov, Phys. Status Solidi (C) 11(3–4), 502 (2014).CrossRefGoogle Scholar
  7. 7.
    C. M. Drum, Phil. Mag. 11(110), 313 (1965).ADSCrossRefGoogle Scholar
  8. 8.
    Y. T. Rebane, Y. G. Shreter, and M. Albrecht, Phys. Status Solidi (A) 164, 141 (1997).ADSCrossRefGoogle Scholar
  9. 9.
    M. A. Reshchikov and H. Morkoç, J. Appl. Phys. 97, 061301 (2005).ADSCrossRefGoogle Scholar

Copyright information

© Pleiades Publishing, Ltd. 2014

Authors and Affiliations

  • D. A. Kirilenko
    • 1
  • A. A. Sitnikova
    • 1
  • A. V. Kremleva
    • 1
    • 2
  • M. G. Mynbaeva
    • 1
    • 3
    • 4
  • V. I. Nikolaev
    • 1
    • 3
    • 4
  1. 1.Ioffe Physical Technical InstituteRussian Academy of SciencesSt. PetersburgRussia
  2. 2.St. Petersburg State Electrotechnical UniversitySt. PetersburgRussia
  3. 3.Perfect Crystals CompanySt. PetersburgRussia
  4. 4.St. Petersburg National Research University of Information Technologies, Mechanics, and OpticsSt. PetersburgRussia

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