Technical Physics Letters

, Volume 33, Issue 2, pp 125–127

Calculating x-ray diffraction from multilayer lateral crystal structures with arbitrary shapes and composition profiles

  • V. I. Punegov
  • A. I. Maksimov
  • S. I. Kolosov
  • K. M. Pavlov
Article

DOI: 10.1134/S1063785007020101

Cite this article as:
Punegov, V.I., Maksimov, A.I., Kolosov, S.I. et al. Tech. Phys. Lett. (2007) 33: 125. doi:10.1134/S1063785007020101

Abstract

A theory of x-ray diffraction in the vertical direction from a lateral crystal having an arbitrary shape and arbitrary depth-composition profile has been developed within the framework of the kinematic approximation. The results of a numerical simulation of diffraction patterns from such crystals in high-resolution triple-axis diffractometry scheme are presented.

PACS numbers

41.50.th 42.25.Fx 

Copyright information

© Pleiades Publishing, Ltd. 2007

Authors and Affiliations

  • V. I. Punegov
    • 1
    • 2
  • A. I. Maksimov
    • 1
  • S. I. Kolosov
    • 2
  • K. M. Pavlov
    • 3
  1. 1.Komi Scientific Center, Ural DivisionRussian Academy of SciencesSyktyvkar, Komi RepublicRussia
  2. 2.Syktyvkar State UniversitySyktyvkar, Komi RepublicRussia
  3. 3.Center for Synchrotron Science, School of PhysicsMonash UniversityMelbourneAustralia

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