Calculating x-ray diffraction from multilayer lateral crystal structures with arbitrary shapes and composition profiles
- Cite this article as:
- Punegov, V.I., Maksimov, A.I., Kolosov, S.I. et al. Tech. Phys. Lett. (2007) 33: 125. doi:10.1134/S1063785007020101
A theory of x-ray diffraction in the vertical direction from a lateral crystal having an arbitrary shape and arbitrary depth-composition profile has been developed within the framework of the kinematic approximation. The results of a numerical simulation of diffraction patterns from such crystals in high-resolution triple-axis diffractometry scheme are presented.