Atomic-Force Microscopy of Resistive Nonstationary Signal Switching in ZrO2(Y) Films
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Local resistive switching by complex nonstationary signals in zirconium-dioxide-stabilized films on conducting substrates has been studied by atomic-force microscopy with a conducting probe. Film resistance was switched by triangular voltage pulses on which a high-frequency sinusoidal signal was superimposed. It is found that the ratio of currents through the junction between the probe and film surface in high-resistance and low-resistance states increases after the superposition of a sinusoidal signal (as compared to switching by simple triangular pulses). An increase in the temporal stability of the current strength in these states was also found when switching with a sinusoidal signal. This effect is associated with resonant activation of oxygen ion migration over vacancies in an external ac electric field.
AFM experiments were performed using the facilities of the Collective Use Center, Science and Education Center Physics of Solid-State Nanostructures, Lobachevsky State University.
This study was supported by the Russian Foundation for Basic Research and the administration of the Nizhny Novgorod oblast (project no. 18-42-520059r_a).
CONFLICT OF INTEREST
The authors claim that there are no conflicts of interests.
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