Technical Physics

, Volume 61, Issue 3, pp 470–472 | Cite as

Selection and design of the secondary electron channel of the time-of-flight mass spectrometer

  • T. Ya. Fishkova
  • A. A. Basalaev
  • V. V. Kuz’michev
Short Communications
  • 25 Downloads

Abstract

Computer simulation is carried out for selecting a compact electron-optical system of the channel for detecting secondary electrons formed during the interaction of xenon atoms or ions with energy of 1-30 keV with Xe atoms. The solid angle of passage of secondary electron beams in a wide range of their initial energies is calculated. The energy spectrum of secondary electrons with various energies is determined by constructing their deceleration curve.

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Copyright information

© Pleiades Publishing, Ltd. 2016

Authors and Affiliations

  • T. Ya. Fishkova
    • 1
  • A. A. Basalaev
    • 1
  • V. V. Kuz’michev
    • 1
    • 2
  1. 1.Ioffe Physical Technical InstituteRussian Academy of SciencesSt. PetersburgRussia
  2. 2.Peter the Great St. Petersburg Polytechnic UniversitySt. PetersburgRussia

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