Technical Physics

, Volume 61, Issue 3, pp 470–472 | Cite as

Selection and design of the secondary electron channel of the time-of-flight mass spectrometer

  • T. Ya. FishkovaEmail author
  • A. A. Basalaev
  • V. V. Kuz’michev
Short Communications


Computer simulation is carried out for selecting a compact electron-optical system of the channel for detecting secondary electrons formed during the interaction of xenon atoms or ions with energy of 1-30 keV with Xe atoms. The solid angle of passage of secondary electron beams in a wide range of their initial energies is calculated. The energy spectrum of secondary electrons with various energies is determined by constructing their deceleration curve.


Secondary Electron Solid Angle Ionization Cross Section Ioffe Physical Technical Institute Recoil Nucleus 
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Copyright information

© Pleiades Publishing, Ltd. 2016

Authors and Affiliations

  • T. Ya. Fishkova
    • 1
    Email author
  • A. A. Basalaev
    • 1
  • V. V. Kuz’michev
    • 1
    • 2
  1. 1.Ioffe Physical Technical InstituteRussian Academy of SciencesSt. PetersburgRussia
  2. 2.Peter the Great St. Petersburg Polytechnic UniversitySt. PetersburgRussia

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