Technical Physics

, Volume 59, Issue 10, pp 1476–1481 | Cite as

Growth of metallic Ag whisker single crystals on AgI films

Physical Science of Materials

Abstract

The growth of silver whisker nanocrystals (WNCs) on the surface of an AgI film deposited by laser ablation is studied on a Zeiss Merlin scanning electron microscope. The chemical composition of WNCs is determined by electron-probe microanalysis. The growth rate of WNCs is estimated. Possible WNC growth mechanisms under the action of an electron beam are considered.

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References

  1. 1.
    G. Burley, Am. Mineral. 48, 1266 (1963).Google Scholar
  2. 2.
    A. B. Yaroslavtsev, Russ. Chem. Rev. 78, 1013 (2009).CrossRefADSGoogle Scholar
  3. 3.
    S. F. Chernov, Opt. Spectrosc. 59, 511 (1985).Google Scholar
  4. 4.
    E. A. Ukshe and N. G. Bukun, Solid Electrolites (Nauka, Moscow, 1977).Google Scholar
  5. 5.
    K. Wakamura, Solid State Ionics 180, 1343 (2009).CrossRefGoogle Scholar
  6. 6.
    R. W. Gurney and N. F. Mott, Proc. R. Soc. London, Ser. A 164(917), 151 (1938).CrossRefADSGoogle Scholar
  7. 7.
    T. A. Babcock, P. M. Fergusson, and T. H. James, Photograph. Sci. Eng. 19, 49 (1975).Google Scholar
  8. 8.
    A. L. Kartuzhanskai, Usp. Fiz. Nauk 50, 341 (1954).CrossRefGoogle Scholar
  9. 9.
    J. W. Mitchell, Rep. Prog. Phys. 20, 433 (1957); Usp. Fiz. Nauk 67, 293 (1959); Usp. Fiz. Nauk 67, 505 (1959).CrossRefADSGoogle Scholar
  10. 10.
    Earl N. Mitchell, Photographic Science (Wiley, New York, 1984).Google Scholar
  11. 11.
    N. F. Uvanov, P. Vanek, M. Savinov, V. Zelezny, V. Studnicka, and J. Petzelt, Solid State Ionics 127, 253 (2000).CrossRefGoogle Scholar
  12. 12.
    C. C. Liang, J. Electrochem. Soc. 120, 1289 (1973).CrossRefGoogle Scholar
  13. 13.
    J. Maier, Solid State Ionics 154, 291 (2002).CrossRefGoogle Scholar
  14. 14.
    J. Maier, Solid State Ionics 148, 367 (2002).CrossRefGoogle Scholar
  15. 15.
    N. Sata, N. Y. Jin-Phillipp, K. Eberl, and J. Maier, J. Maier, Solid State Ionics 154–155, 497 (2002).CrossRefGoogle Scholar
  16. 16.
    Yu. S. Tver’yanovich, M. D. Bal’makov, V. V. Tomaev, E. N. Borisov, and O. Volobueva, Glass Phys. Chem. 34, 150 (2008).CrossRefGoogle Scholar
  17. 17.
    V. V. Tomaev, Yu. S. Tver’yanovich, M. D. Bal’makov, I. A. Zvereva, and A. B. Missyul’, Glass Phys. Chem. 36, 455 (2010).CrossRefGoogle Scholar
  18. 18.
    V. V. Tomaev, Yu. S. Tver’yanovich, and M. D. Bal’makov, Crystallogr. Rep. 57, 948 (2012).CrossRefADSGoogle Scholar
  19. 19.
    V. V. Tomaev, Yu. S. Tver’yanovich, and M. D. Bal’makov, Glass Phys. Chem. 38, 155 (2012).CrossRefGoogle Scholar
  20. 20.
    V. G. Dubrovskii, G. E. Tsyrlin, and V. M. Ustinov, Semiconductors 43, 1539 (2009).CrossRefADSGoogle Scholar
  21. 21.
    V. G. Dubrovskii, N. V. Sibirev, and G. E. Cirlin, Tech. Phys. Lett. 30, 272 (2004).CrossRefADSGoogle Scholar
  22. 22.
    N. V. Sibirev, M. V. Nazarenko, G. E. Cirlin, Yu. B. Sam- sonenko, and V. G. Dubrovskii, Semiconductors 44, 112 (2010).CrossRefADSGoogle Scholar
  23. 23.
    M. N. Lubov, D. V. Kulikov, and Yu. V. Trushin, Tech. Phys. 55, 85 (2010).CrossRefGoogle Scholar
  24. 24.
    L. Xu, B. Dong, Y. Wang, X. Bai, Q. Liu, and H. Song, Sens. Actuators B 147, 531 (2010).CrossRefGoogle Scholar
  25. 25.
    S. K. Lim, S. Hwang, D. Chang, and S. Kim, Sens. Actuators B 149, 28 (2010).CrossRefGoogle Scholar
  26. 26.
    S. Budak and G. X. Miao, J. Cryst. Growth 291, 405 (2006).CrossRefADSGoogle Scholar
  27. 27.
    Y. Zhang, K. Yu, G. Li, D. Peng, Q. Zhang, F. Xu, W. Bai, S. Ouyang, and Z. Zhu, Mater. Lett. 60, 3109 (2006).CrossRefGoogle Scholar
  28. 28.
    S. Lettieri, A. Bismuto, P. Maddalena, et al., J. Non-Cryst. Solids 352, 1457 (2006).CrossRefADSGoogle Scholar
  29. 29.
    I. Kh. Akopyan, M. E. Labzovskaya, B. V. Novikov, and D. A. Tsagan-Mandzhieva, Tech. Phys. 57, 220 (2012).CrossRefGoogle Scholar
  30. 30.
    V. A. Moshnikov and V. V. Tomaev, Izv. St. Peterb. Gos. Electroteckh. Univ., No. 1, 10 (2003).Google Scholar
  31. 31.
    V. V. Tomaev and Yu. V. Petrov, Glass Phys. Chem. 38, 339 (2012).CrossRefGoogle Scholar
  32. 32.
    B. U. Barshchevskii, Phys. Usp. 44, 397 (2001).CrossRefADSGoogle Scholar
  33. 33.
    Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis, Ed. by J. I. Goldstein and H. Yakowitz (Plenum, New York, 1975).Google Scholar
  34. 34.
    D. Drouin, A. Couture, D. Joly, X. Tastet, V. Aimez, and R. Gauvin, Scanning 29, 92 (2007).CrossRefGoogle Scholar
  35. 35.
    S. J. B. Reed, Electron Microprobe Analysis and Scanning Electron Microscopy in Geology (Cambridge Univ., Cambridge, 2010).Google Scholar
  36. 36.
    N. F. Mott and R. W. Gurney, Electronic Processes in Ionic Crystals, 2nd ed. (Clarendon, Oxford, 1948).Google Scholar
  37. 37.
    E. S. Wagner and W. C. Ellis, Appl. Phys. Lett. 4, 89 (1964).CrossRefADSGoogle Scholar

Copyright information

© Pleiades Publishing, Ltd. 2014

Authors and Affiliations

  • V. A. Polishchuk
    • 1
    • 2
  • V. V. Tomaev
    • 1
    • 2
  • A. V. Baranov
    • 1
  1. 1.St. Petersburg National Research University of Information Technologies, Mechanics, and OpticsSt. PetersburgRussia
  2. 2.St. Petersburg State UniversitySt. PetersburgRussia
  3. 3.St. Petersburg National Mineral Raw Materials University GornyiSt. PetersburgRussia

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