, Volume 52, Issue 13, pp 1669–1671 | Cite as

Measurement of the Charge-Carrier Mobility in Gallium Arsenide Using a Near-Field Microwave Microscope by the Microwave-Magnetoresistance Method

  • D. A. Usanov
  • A. E. Postelga
  • A. A. KalyaminEmail author
  • I. V. Sharov


The possibility of contactless nondestructive local measurements of the microwave carrier mobility in gallium arsenide using a near-field scanning microwave microscope and the effect of microwave magnetoresistance is shown. The need to consider the effect of a shift of the microwave field in processing the result of the measurements is noted.



  1. 1.
    W. Chaisantikulwat, M. Mouis, G. Ghibaudo, C. Gallon, C. Fenouillet-Beranger, D. K. Maude, T. Skotnicki, and S. Cristoloveanu, Solid-State Electron. 50, 637 (2006).ADSCrossRefGoogle Scholar
  2. 2.
    B. Molnar and T. A. Kenedy, J. Electrochem. Soc. Solid-State Sci. Technol. 125, 1318 (1978).Google Scholar
  3. 3.
    V. S. Bannikov, Yu. G. Kachurovskii, and I. V. Petrenko, Elektron. Prom-st’, No. 9, 48 (1982).Google Scholar
  4. 4.
    S. M. Bezruchko, V. N. Podshivalov, and A. I. Fisun, Elektron. Prom-st’, No. 3, 66 (1986).Google Scholar
  5. 5.
    D. Usanov, A. Skripal, A. Abramov, A. Bogolubov, V. Skvortsov, and M. Merdanov, in Proceedings of the 37rd European Microwave Conference, Munich, Germany, 2010, p. 198.Google Scholar
  6. 6.
    D. Usanov, A. Skripal, D. Ponomarev, E. Latysheva, and S. Nikitov, in Proceedings of the 20th International Conference on Microwaves, Radar, and Wireless Communications MIKON-2014, Gdansk, Poland, 2014, Vol. 1, p. 62.Google Scholar
  7. 7.
    D. A. Usanov, Near-Field Scanning Microwave Microscopy and Its Application (Sarat. Univ., Saratov, 2010), p. 100 [in Russian].Google Scholar
  8. 8.
    P. Gregory, J. F. Blackburn, K. Lees, R. N. Clarke, T. E. Hodgetts, S. M. Hanham, and N. Klein, Ultramicroscopy 161, 137 (2016).CrossRefGoogle Scholar
  9. 9.
    D. A. Usanov and S. S. Gorbatov, Instrum. Exp. Tech. 49, 388 (2006).CrossRefGoogle Scholar
  10. 10.
    M. Levinshtein, S. Rumyantsev, and M. Shur, Handbook Series on Semiconductor Parameters (World Scientific, Singapore, New Jersey, London, Hong Kong, 1996), Vol. 1, p. 84.CrossRefGoogle Scholar
  11. 11.
    L. G. Parratt, Phys. Rev. 95, 359 (1954).ADSCrossRefGoogle Scholar
  12. 12.
    H. E. M. Barlow and R. Koike, Proc. IEEE 110, 2177 (1963).Google Scholar
  13. 13.
    L. N. Baranov, V. B. Gamanyuk, and D. A. Usanov, Radiotekh. Elektron. 18 (11), 73 (1973).Google Scholar

Copyright information

© Pleiades Publishing, Ltd. 2018

Authors and Affiliations

  • D. A. Usanov
    • 1
  • A. E. Postelga
    • 1
  • A. A. Kalyamin
    • 1
    Email author
  • I. V. Sharov
    • 1
  1. 1.National Research Saratov State University named after N.G. ChernyshevskySaratovRussia

Personalised recommendations