, Volume 52, Issue 5, pp 671–674 | Cite as

Resistance Switching in Ag, Au, and Cu Films at the Percolation Threshold

  • I. A. Gladskikh
  • M. G. Gushchin
  • T. A. Vartanyan
XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Technology


A straightforward method for thin metal films production and bringing them at the percolation threshold has been developed. The method is based on the controlled thermal annealing of initially conductive metal films. Electrical conductivity studies of thin silver, gold, and copper films at the percolation threshold revealed the existence of high-resistance states (1012 Ω) and low-resistance states (103 Ω) of the films. The switching between these states under bias is reversible. The characteristic switching times are 200 ns, 2 μs, and 60 μs for silver, gold, and copper films, correspondently.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    A. Kiesow, J. E. Morris, C. Radehaus, and A. l. Heilmann, J. Appl. Phys. 94, 6988 (2003).ADSCrossRefGoogle Scholar
  2. 2.
    D. K. Sarkar, F. Cloutier, and M. A. El Khakani, J. Appl. Phys. 97, 084302 (2005).ADSCrossRefGoogle Scholar
  3. 3.
    P. V. Gladskikh, I. A. Gladskikh, N. A. Toropov, M. A. Baranov, and T. A. Vartanyan, J. Nanopart. Res. 17, 424 (2015).ADSCrossRefGoogle Scholar
  4. 4.
    I. A. Gladskikh, V. A. Polishchuk, and T. A. Vartanyan, Phys. Solid State 59, 601 (2017).ADSCrossRefGoogle Scholar
  5. 5.
    K. Terabe, T. Hasegawa, T. Nakayama, and M. Aono, Nature (London, U.K.) 433, 47 (2005).ADSCrossRefGoogle Scholar
  6. 6.
    R. Waser and M. Aono, Nat. Mater. 6, 833 (2007).ADSCrossRefGoogle Scholar
  7. 7.
    T. Vartanyan, I. Gladskikh, N. Leonov, and S. Przhibel’skii, Phys. Solid State 56, 816 (2014).ADSCrossRefGoogle Scholar
  8. 8.
    H. Wei and H. Eilers, J. Phys. Chem. Solids 70, 459 (2009).ADSCrossRefGoogle Scholar
  9. 9.
    S. Wagner and A. Pundt, Phys. Rev. B 78, 155131 (2008).ADSCrossRefGoogle Scholar
  10. 10.
    J. Wu, Z. Wang, K. Wu, J. Zhang, C. Li, and D. Yin, Thin Solid Films 295, 315 (1997).ADSCrossRefGoogle Scholar
  11. 11.
    I. A. Gladskikh, N. B. Leonov, S. G. Przhibel’skii, and T. A. Vartanyan, J. Opt. Technol. 81, 280 (2014).CrossRefGoogle Scholar
  12. 12.
    N. B. Leonov, I. A. Gladskikh, V. A. Polishchuk, and T. A. Vartanyan, Opt. Spectrosc. 119, 450 (2015).ADSCrossRefGoogle Scholar
  13. 13.
    H. C. Kim, T. L. Alford, and D. R. Allee, Appl. Phys. Lett. 81, 4287 (2002).ADSCrossRefGoogle Scholar
  14. 14.
    K. Aslan, Z. Leonenko, J. R. Lakowicz, and C. D. Geddes, J. Fluoresc. 15, 643 (2005).CrossRefGoogle Scholar

Copyright information

© Pleiades Publishing, Ltd. 2018

Authors and Affiliations

  • I. A. Gladskikh
    • 1
  • M. G. Gushchin
    • 1
  • T. A. Vartanyan
    • 1
  1. 1.Saint Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)St. PetersburgRussia

Personalised recommendations