Semiconductors

, 42:1496 | Cite as

Carbon nanomaterial studied by atomic-force and electron microscopies

  • I. I. Bobrinetskĭ
  • V. N. Kukin
  • V. K. Nevolin
  • M. M. Simunin
Materials for Electronic Engineering

Abstract

It is suggested to use the atomic-force microscopy (AFM) and transmission electron microscopy (TEM) to study carbon material synthesized by catalytic pyrolysis of ethanol. It is shown how AFM and TEM can be employed to determine the geometric parameters of carbon nanofibers and nanotubes, examine their mechanical and adhesion characteristics, and analyze their structure.

PACS numbers

81.07.-b 81.07.De 

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Copyright information

© Pleiades Publishing, Ltd. 2008

Authors and Affiliations

  • I. I. Bobrinetskĭ
    • 1
  • V. N. Kukin
    • 1
  • V. K. Nevolin
    • 1
  • M. M. Simunin
    • 1
  1. 1.Moscow State Institute of Electronics (Technical University)MoscowRussia

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