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Crystallography Reports

, 56:858 | Cite as

Precision structural diagnostics of layered superconductor/ferromagnet nanosystems V/Fe by reflectometry and diffuse scattering of synchrotron radiation

  • A. M. Nikitin
  • M. M. Borisov
  • E. Kh. Mukhamedzhanov
  • M. V. Kovalchuk
  • S. Sajti
  • F. Tancziko
  • L. Deak
  • L. Bottyan
  • Yu. N. Khaydukov
  • V. L. Aksenov
Surface and Thin Films

Abstract

Layered superconducting ferromagnetic nanosystems Cu(32 nm)/V(40–80 nm)/Fe(0.5–4 nm)/MgO(001) have been investigated by reflectometry and the diffuse scattering of synchrotron radiation. The data obtained make it possible to determine the important characteristics of samples such as the layer thickness and the rms heights and lateral correlation lengths of roughness at the interfaces.

Keywords

Crystallography Report Diffuse Scattering Ferromagnetic Layer Scatter Length Density Distort Wave Bear Approximation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Pleiades Publishing, Ltd. 2011

Authors and Affiliations

  • A. M. Nikitin
    • 1
    • 2
  • M. M. Borisov
    • 2
  • E. Kh. Mukhamedzhanov
    • 2
  • M. V. Kovalchuk
    • 2
    • 3
  • S. Sajti
    • 4
  • F. Tancziko
    • 4
  • L. Deak
    • 4
  • L. Bottyan
    • 4
  • Yu. N. Khaydukov
    • 1
  • V. L. Aksenov
    • 1
  1. 1.Moscow State UniversityMoscowRussia
  2. 2.National Research Center Kurchatov InstituteMoscowRussia
  3. 3.Shubnikov Institute of CrystallographyRussian Academy of SciencesMoscowRussia
  4. 4.KFKI Research Institute for Particle and Nuclear PhysicsHungarian Academy of SciencesBudapestHungary

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