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Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects

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Abstract

This paper is devoted to analyzing the effect of gamma radiation on the behavior of optocouplers. According to a series of experiments that involve masking various parts of a chip from X-ray irradiation, the most sensitive region of the chip is determined and the design of the optocoupler is improved. Upon modification, the radiation hardness of the device more than triples.

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Author information

Correspondence to M. E. Chernyak or A. V. Ulanova.

Additional information

Translated by Yu. Kornienko

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Chernyak, M.E., Ranneva, E.V., Ulanova, A.V. et al. Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects. Russ Microelectron 48, 415–421 (2019). https://doi.org/10.1134/S1063739719060039

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Keywords:

  • dose effects
  • optocouplers
  • and X-ray methods