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Russian Microelectronics

, Volume 38, Issue 4, pp 257–259 | Cite as

An automated stand for express-diagnostics of magnetoresistive structures

  • O. S. Trushin
  • D. A. Kokanov
  • V. F. Bochkarev
  • V. V. Naumov
  • E. Yu. Buchin
Micro- and Nanostructure Characterization

Abstract

The design of an automated measuring stand for express-diagnostics of magnetoresistive structures are presented. This computer-controlled stand allows measurements of the magnetoresistances of film structures with high accuracy in a low alternating magnetic field. The stand has been tested on single- and multiple-layer magnetoresistive structures.

PACS

81.15.-z 

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Copyright information

© Pleiades Publishing, Ltd. 2009

Authors and Affiliations

  • O. S. Trushin
    • 1
  • D. A. Kokanov
    • 1
  • V. F. Bochkarev
    • 1
  • V. V. Naumov
    • 1
  • E. Yu. Buchin
    • 1
  1. 1.Yaroslavl’ Branch of the Physicotechnologycal InstituteRussian Academy of SciencesYaroclavl’Russia

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