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Russian Microelectronics

, Volume 36, Issue 3, pp 164–170 | Cite as

Polymer surface deformation under semicontact-mode AFM scanning

  • A. B. Petrov
  • R. R. Gallyamov
Thin Films

Abstract

An experiment and a computer simulation are presented concerning the tip-induced deformation of polyethylene under semicontact-mode AFM scanning. The dependence is investigated of the deformation on normalized amplitude of scanning with due regard to cantilever damping. The measured and the simulated deformation curve are found to agree for sufficiently large normalized scanning amplitudes. Otherwise, the experiment and the simulation diverge. Reasons for this disagreement are suggested within the context of different physical processes influencing the deformation.

PACS numbers

68.37.Ps 

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References

  1. 1.
    Sarid, D., Scanning Force Microscopy with Applications to Electric, Magnetic, and Atomic Forces, New York: Oxford Univ. Press, 1991.Google Scholar
  2. 2.
    Burnham, N.A., Colton, R.J., and Pollock, H.M., Nanotechnology, 1993, vol. 4, pp. 64–80.CrossRefGoogle Scholar
  3. 3.
    Garcia, R. and Perez, R., Surf. Sci. Rep., 2002, vol. 47, pp. 197–301.zbMATHCrossRefGoogle Scholar
  4. 4.
    Gainutdinov, R.V. and Arutyunov, P.A., Mikroelektronika, 2001, vol. 30, pp. 257–265 [Russ. Microelectron. (Engl. Transl.), vol. 30, pp. 219–224].Google Scholar
  5. 5.
    Arutyunov, P.A. and Tolstikhina, A.L., Mikroelektronika, 1997, vol. 26, pp. 426–439 [Russ. Microelectron. (Engl. Transl.), vol. 26, pp. 365–377].Google Scholar
  6. 6.
    Chizhik, S.A., Ahn, H.-S., Shashalko, D.I., et al., Phys. Low-Dim. Struct., 2002, nos. 5–6, pp. 25–30.Google Scholar
  7. 7.
    Polyakov, V.A., Duntov, F.I., Sofiev, A.E., et al., Polietilen vysokogo davleniya (High-Pressure Polyethylene), Leningrad: Khimiya, 1988.Google Scholar
  8. 8.
    Rukovodstvo pol’zovatelya, P47-SPM-MDT-skaniruyushchii zondovyi mikroskop (P47-SPM-MDT Scanning-Probe Microscope: User Manual), Moscow: State Research Institute of Physical Problems, 1997.Google Scholar
  9. 9.
    Burnham, N.A., Behrend, O.P., Oulevey, F., et al., Nanotechnology, 1997, vol. 8, pp. 67–75.CrossRefGoogle Scholar
  10. 10.
    Wang, L., Surf. Sci., 1999, vol. 429, pp. 178–185.CrossRefGoogle Scholar
  11. 11.
    Fontaine, P., Guenoun, P., and Daillant, J., Rev. Sci. Instrum., 1997, vol. 68, pp. 4145–4151.CrossRefGoogle Scholar
  12. 12.
    Landau, L.D. and Lifshitz, E.M., Teoreticheskaya fizika (Theoretical Physics), vol. 7: Teoriya uprugosti (Theory of Elasticity), Moscow: Nauka, 1987.Google Scholar
  13. 13.
    Anczykowski, B., Gotsmann, B., Fuchs, H., et al., Appl. Surf. Sci., 1999, vol. 140, pp. 376–382.CrossRefGoogle Scholar
  14. 14.
    Petrov, A.B., Gallyamov, R.R., Gainullin, D.V., et al., in Tezisy dokladov, XIV Rossiiskii simpozium po rastrovoi elektronnoi mikroskopii i analiticheskim metodam issledovaniya tverdykh tel, REM 2005 (XIV National Symp. on Scanning Electron Microscopy and Characterization of Solids, REM 2005, Abstracts of Papers), Chernogolovka, Moscow oblast, Russia, 2005, p. 69.Google Scholar

Copyright information

© Pleiades Publishing, Ltd. 2007

Authors and Affiliations

  • A. B. Petrov
    • 1
  • R. R. Gallyamov
    • 1
  1. 1.Bashkir State UniversityUfa, BashkortostanRussia

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