Colloid Journal

, Volume 68, Issue 4, pp 481–493 | Cite as

On the parameterization of surface structures

  • S. F. Timashev
  • V. E. Belyaev
  • P. S. Timashev
  • A. B. Solov’eva
Article

Abstract

The procedure for the parameterization of complex surface structures is proposed on the basis of the analysis of spatial “series” formed by the projections on the coordinate axes of roughness profiles recorded during the surface scanning with the sensitive element of atomic force microscope. To extract parameters of thus obtained “spatial series,” flicker-noise spectroscopy is used that allows retrieval of information relevant to specific (“resonance”) and nonspecific (chaotic) components of analyzed complex signals.

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Copyright information

© Pleiades Publishing, Inc. 2006

Authors and Affiliations

  • S. F. Timashev
    • 1
    • 2
  • V. E. Belyaev
    • 3
  • P. S. Timashev
    • 2
  • A. B. Solov’eva
    • 3
  1. 1.Karpov Research Institute of Physical ChemistryMoscowRussia
  2. 2.Institute of Laser and Information TechnologiesRussian Academy of SciencesShatura, Moscow oblastRussia
  3. 3.Semenov Institute of Chemical PhysicsRussian Academy of SciencesMoscowRussia

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