X-ray spectra from deuterated crystal structures interacting with ion beams with energies below 25 keV

  • A. V. Bagulya
  • O. D. Dalkarov
  • M. A. Negodaev
  • A. S. Rusetskii
  • V. I. Tsehosh
  • A. A. Bolotokov
Article
  • 26 Downloads

Abstract

The yields of nuclear reactions in textured CVD (chemical vapor deposition) diamond samples irradiated with a deuteron ion beam are measured. The sample orientation in the deuteron beam is shown to influence the value of the DD reaction yield. The X-ray fluorescence spectra from the surface of deuterated targets irradiated with an ion beam are studied. Analysis of the fluorescence spectra revealed “additional” peaks which cannot be associated with any known elements and require separate studies.

Keywords

nuclear reactions ion beams radiation interaction with matter ion accelerator neutron detector X-ray tube 

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References

  1. 1.
    A. V. Bagulya, O. D. Dal’karov, M. A. Negodaev, A. S. Rusetskii, and A. P. Chubenko, Kratk. Soobshch. Fiz., No. 9, 3 (2012).Google Scholar
  2. 2.
    A. V. Bagulya, O. D. Dal’karov, M. A. Negodaev, A. S. Rusetskii, and A. P. Chubenko, Kratk. Soobshch. Fiz., No. 12, 3 (2012).Google Scholar
  3. 3.
    A. V. Bagulya, O. D. Dal’karov, M. A. Negodaev, et al., Kratk. Soobshch. Fiz., No. 10, 15 (2013).Google Scholar
  4. 4.
    A. V. Bagulya, O. D. Dal’karov, M. A. Negodaev, et al., Kratk. Soobshch. Fiz., No. 11, 3 (2013).Google Scholar
  5. 5.
    A. V. Bagulya, O. D. Dalkarov, M. A. Negodaev, A. S. Rusetskii, and A. P. Chubenko, Phys. Scr. 90 (7), 074051 (2015).CrossRefGoogle Scholar
  6. 6.
    A. V. Bagulya, O. D. Dalkarov, M. A. Negodaev, A. S. Rusetskii, A. P. Chubenko, V. G. Ralchenko, and A. P. Bolshakov, Nucl. Instrum. Methods Phys. Res., Sect. B 355, 340 (2015)CrossRefGoogle Scholar
  7. 7.
    V. G. Ralchenko, E. Pleuler, F. X. Lu, D. N. Sovyk, A. P. Bolshakov, S. B. Guo, W. Z. Tang, I. V. Gontar, A. A. Khomich, E. V. Zavedeev, and V. I. Konov, Diamond Relat. Mater. 23, 172 (2012).CrossRefGoogle Scholar
  8. 8.
    A. V. Bagulya, O. D. Dal’karov, M. A. Negodaev, A. S. Rusetskii, and V. G. Ral’chenko, RF Patent No. 2 568 305, Byull. Izobret., No. 32 (2015).Google Scholar
  9. 9.
    XR-100CR X-ray detector, http://amptek.com/product/ xr-100cr-si-pin-x-ray-detector.Google Scholar
  10. 10.
    V. M. Bystritskii, Vit. M. Bystritskii, G. N. Dudkin, M. Filipovich, Sh. Gazhi, I. Guran, G. A. Mesyats, B. A. Nechaev, V. N. Padalko, S. S. Parzhitskii, F. M. Pen’kov, A. V. Filippov, and Yu. Zh. Tuleushev, JETP 119 (1), 54 (2014).CrossRefGoogle Scholar
  11. 11.
    V. M. Bystritskii, Vit. M. Bystritskii, G. N. Dudkin, M. Filipovich, Sh. Gazhi, I. Guran, G. A. Mesyats, B. A. Nechaev, V. N. Padalko, S. S. Parzhitskii, F. M. Pen’kov, A. V. Filippov, and Yu. Zh. Tuleushev, JETP Lett. 99 (9), 497 (2014).CrossRefGoogle Scholar

Copyright information

© Pleiades Publishing, Ltd. 2017

Authors and Affiliations

  • A. V. Bagulya
    • 1
  • O. D. Dalkarov
    • 1
  • M. A. Negodaev
    • 1
  • A. S. Rusetskii
    • 1
  • V. I. Tsehosh
    • 1
  • A. A. Bolotokov
    • 2
  1. 1.Lebedev Physical InstituteRussian Academy of SciencesMoscowRussia
  2. 2.PC NPP “Radiy”MoscowRussia

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