High-resolution X-ray diffraction based on 1D and 2D refractive lenses
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The results of studying a silicon-germanium (Si-Ge) nanoheterostructure using refractive X-ray optics are described. The diffraction patterns near the silicon Bragg-diffraction peak 400 in the focal plane of refractive lenses are recorded and analyzed. The experiments are carried out in two different geometries: using 1D and 2D X-ray compound refractive lenses.
KeywordsSi-Ge heterostructures 1D and 2D X-ray refractive lenses triple-crystal X-ray diffractometry
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