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High-resolution X-ray diffraction based on 1D and 2D refractive lenses

  • P. A. ErshovEmail author
  • S. M. Kuznetsov
  • I. I. Snigireva
  • V. A. Yunkin
  • A. Yu. Goikhman
  • A. A. Snigirev
Article

Abstract

The results of studying a silicon-germanium (Si-Ge) nanoheterostructure using refractive X-ray optics are described. The diffraction patterns near the silicon Bragg-diffraction peak 400 in the focal plane of refractive lenses are recorded and analyzed. The experiments are carried out in two different geometries: using 1D and 2D X-ray compound refractive lenses.

Keywords

Si-Ge heterostructures 1D and 2D X-ray refractive lenses triple-crystal X-ray diffractometry 

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Copyright information

© Pleiades Publishing, Ltd. 2015

Authors and Affiliations

  • P. A. Ershov
    • 1
    Email author
  • S. M. Kuznetsov
    • 2
  • I. I. Snigireva
    • 3
  • V. A. Yunkin
    • 2
  • A. Yu. Goikhman
    • 1
  • A. A. Snigirev
    • 3
  1. 1.Kant Baltic Federal UniversityKaliningradRussia
  2. 2.Institute of Microelectronics Technology and High Purity MaterialsRussian Academy of SciencesChernogolovka, Moscow oblastRussia
  3. 3.European Synchrotron Radiation Facility (ESRF)GrenobleFrance

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