Surface transition-layer model used to study the fine structure of X-ray reflection spectra
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Experimental and theoretical studies are performed to characterize the X-ray reflection spectra obtained in the case of the grazing incidence of monochromatic radiation on the plane surface of single- and polycrystalline quartz samples and the channel walls of microchannel plates. It is established that the theoretically calculated fine structures of the X-ray spectra and those measured with a high resolution are closely coincident at energies corresponding to an anomalous dispersion region near the SiL 2,3 absorption edge. Theoretical calculations are carried out using a model involving a transition layer on a sample surface.
KeywordsSurface Investigation Neutron Technique Grazing Angle Photoabsorption Cross Section Synchrotron Neutron Tech
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- 6.F. Shafers, H.-C.h. Martins, A. Gaupp, et al., Appl. Phys. 38, 4074 (1999).Google Scholar
- 9.L. D. Landau and E. M. Lifshits, Course of Theoretical Physics, Vol. 3: Quantum Mechanics: Nonrelativistic Theory (Nauka, Moscow, 1989; Pergamon, New York, 1977).Google Scholar
- 10.L. D. Landau and E. M. Lifshits, Electrodynamics of Continuos Media (Pergamon, New York, 1960).Google Scholar
- 11.V. B. Berestetskii, E. M. Lifshits, and L. P. Pitaevskii, Quantum Electrodynamics (Nauka, Moscow, 1980; Pergamon, Oxford, 1982).Google Scholar
- 12.G. Bateman and A. Erdelyi, Tables of Integral Transforms (McGraw-Hill, New York, 1954; Nauka, Moscow, 1970), Vol. 2.Google Scholar
- 13.E. Filatova, A. Stepanov, C. Blessing, et al., J. Phys.: Condens. Matter 7, 2731 (1995).Google Scholar