Thermal oxidation of the surface of binary aluminum alloys with rare-earth metals
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The kinetics of oxidation of the surface of Al alloys with 1–2.5 at % rare-earth metals (REMs) at 400–500°C in air was studied by ellipsometry and X-ray photoelectron spectroscopy (XPS). The addition (1–2.5 at % REM) of all rare-earth metals to aluminum was shown to increase the thickness of the oxide layer. The addition of surfactant and chemically active REMs (Yb, Sm, La, and Ce) increased the rate of oxidation of solid aluminum most effectively. The oxidation can be accelerated by the polymorphic transformations of the individual REM oxides in the film. The surface activity of Sm with respect to solid Al was confirmed by XRS.
Keywordsellipsometry X-ray photoelectron spectroscopy aluminum-REM alloys oxide films
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- 1.V. I. Kononenko and V. G. Shevchenko, Physicochemical Activation of Disperse Aluminum-Based Systems (Ural. Otd. RAN, Yekaterinburg, 2006), p. 238 [in Russian].Google Scholar
- 2.S. V. Golubev, V. I. Kononenko, I. N. Latosh, and V. G. Shevchenko, in The Surface and New Materials (Ural. Otd. AN SSSR, Izhevsk, 1990), p. 56 [in Russian].Google Scholar
- 3.V. G. Shevchenko, V. I. Kononenko, A. V. Churaev, et al., Khim. Fiz. 24(6), 1 (2005).Google Scholar
- 4.A. V. Rzhanov, Principles of Ellipsometry (Nauka, Moscow, 1979) [in Russian].Google Scholar
- 5.G. A. Egorova, E. V. Potapov, and A. V. Rakov, Opt. Spectrosc. 41, 377 (1976).Google Scholar
- 6.C. D. Wagner, W. M. Riggs, L. E. Davis, and J. F. Moulder, Handbook of X-ray Photoelectron Spectroscopy, 1st ed. (Perkin-Elmer Corp. (Phys. Electron. Div.), New York, 1979).Google Scholar
- 7.J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy, 2nd ed. (Perkin-Elmer Corp. (Phys. Electron. Div.), New York, 1992).Google Scholar