Topological defects in smectic islands in freely suspended films
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Textures created by point topological defects in defects in polar smectic films have been studied. Such defects have been created by the dynamic method (substance from a very thin film does not have time to approach its edges and thicker islands with a topological defect are controllably formed). Topological defects have been studied in smectic islands with a thickness of six to eight molecular layers in a film with a thickness of two molecular layers. Competition between two-dimensional orientational elasticity in islands and the orientation of the director at the boundary of smectic islands results in different configurations of the field of the c-director created by a topological defect. A transition between configurations occurs at a change in the dimension of islands and depends on the dipole polarization of a liquid crystal. The comparison of the numerical calculations of the structure of topological defects with experimental data has allowed determining the dependence of the anisotropy of the two-dimensional orientational elasticity on the polarization of smectic films.
KeywordsJETP Letter Molecular Layer Topological Defect Polarization Charge Orientational Structure
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