JETP Letters

, Volume 101, Issue 7, pp 453–458 | Cite as

Topological defects in smectic islands in freely suspended films

  • P. V. Dolganov
  • N. S. Shuravin
  • V. K. Dolganov
  • E. I. Kats
Condensed Matter


Textures created by point topological defects in defects in polar smectic films have been studied. Such defects have been created by the dynamic method (substance from a very thin film does not have time to approach its edges and thicker islands with a topological defect are controllably formed). Topological defects have been studied in smectic islands with a thickness of six to eight molecular layers in a film with a thickness of two molecular layers. Competition between two-dimensional orientational elasticity in islands and the orientation of the director at the boundary of smectic islands results in different configurations of the field of the c-director created by a topological defect. A transition between configurations occurs at a change in the dimension of islands and depends on the dipole polarization of a liquid crystal. The comparison of the numerical calculations of the structure of topological defects with experimental data has allowed determining the dependence of the anisotropy of the two-dimensional orientational elasticity on the polarization of smectic films.


JETP Letter Molecular Layer Topological Defect Polarization Charge Orientational Structure 
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Copyright information

© Pleiades Publishing, Inc. 2015

Authors and Affiliations

  • P. V. Dolganov
    • 1
  • N. S. Shuravin
    • 1
    • 2
  • V. K. Dolganov
    • 1
  • E. I. Kats
    • 3
  1. 1.Institute of Solid State PhysicsRussian Academy of SciencesChernogolovka, Moscow regionRussia
  2. 2.Moscow Institute of Physics and Technology (State University)Dolgoprudnyi, Moscow regionRussia
  3. 3.Landau Institute for Theoretical PhysicsRussian Academy of SciencesMoscowRussia

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