JETP Letters

, Volume 96, Issue 12, pp 807–811 | Cite as

Features of the scattering of focused terahertz radiation from the probe of a terahertz near-field microscope

  • V. N. Trukhin
  • L. L. Samoylov
  • D. P. Khor’kov
Miscellaneous

Abstract

The scattering of pulsed terahertz radiation from metallic probes in the form of thin cylinders and cones with a small opening angle, which are used in apertureless terahertz near-field microscopes, has been investigated. The extrema of the waveform of pulsed terahertz radiation scattered from a free probe are linearly shifted with a change in the vertical position of the probe, and the spectral distribution is characterized by an inversely proportional frequency dependence. In the presence of a reflecting surface under the probe, when new excitation and detection directions appear, the spectrum of scattered terahertz radiation does not differ from the spectrum of the incident radiation. The experimental data are in mutual agreement with the theoretical results obtained within the model of the generation of diffraction edge waves at the interface of inhomogeneous excitation between the excitation region and shadow region.

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Copyright information

© Pleiades Publishing, Ltd. 2012

Authors and Affiliations

  • V. N. Trukhin
    • 1
    • 2
  • L. L. Samoylov
    • 1
    • 2
  • D. P. Khor’kov
    • 1
    • 2
  1. 1.Ioffe Physical Technical InstituteRussian Academy of SciencesSt. PetersburgRussia
  2. 2.National Research University of Information Technologies, Mechanics, and OpticsSt. PetersburgRussia

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