JETP Letters

, Volume 96, Issue 10, pp 668–673 | Cite as

Critical current in planar SNS Josephson junctions

  • T. E. Golikova
  • F. Hübler
  • D. Beckmann
  • N. V. Klenov
  • S. V. Bakurskiy
  • M. Yu. Kupriyanov
  • I. E. Batov
  • V. V. Ryazanov
Condensed Matter

Abstract

Specific features of the proximity effect and Josephson behavior of submicron planar SNS junctions fabricated by electron beam lithography and shadow evaporation have been studied experimentally and theoretically. The critical current of the junctions has been found to drastically increase with a decrease in temperature, which is associated with a change in the effective size of the weak link owing to the additional SN interface.

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Copyright information

© Pleiades Publishing, Ltd. 2012

Authors and Affiliations

  • T. E. Golikova
    • 1
  • F. Hübler
    • 2
  • D. Beckmann
    • 2
  • N. V. Klenov
    • 3
  • S. V. Bakurskiy
    • 3
  • M. Yu. Kupriyanov
    • 3
  • I. E. Batov
    • 1
  • V. V. Ryazanov
    • 1
    • 4
  1. 1.Institute of Solid State PhysicsRussian Academy of SciencesChernogolovka, Moscow regionRussia
  2. 2.Institute of NanotechnologyKarlsruhe Institute of TechnologyKarlsruheGermany
  3. 3.Skobeltsyn Institute of Nuclear PhysicsMoscow State UniversityMoscowRussia
  4. 4.Moscow Institute of Physics and Technology (State University)Dolgoprudnyi, Moscow regionRussia

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