Instruments and Experimental Techniques

, Volume 53, Issue 4, pp 613–619 | Cite as

Single-crystal diamond probes for atomic-force microscopy

  • P. G. Kopylov
  • B. A. Loginov
  • R. R. Ismagilov
  • A. N. Obraztsov
Laboratory Techniques

Abstract

The results of investigations aimed at the development and testing of diamond probes for scanning atomic-force microscopy are presented. Plasmochemical deposition of diamond polycrystalline films and selective thermal oxidation were used to manufacture diamond probes. The obtained single-crystal diamond pyramidal tips of micron size had a radius of curvature of 2–20 nm at the top. The diamond tips were attached to a cantilever with an epoxy adhesive and then tested as probes in scanning atomic-force microscopy. Tests have shown that the manufactured diamond probes have appreciable advantages over conventional probes.

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Copyright information

© Pleiades Publishing, Ltd. 2010

Authors and Affiliations

  • P. G. Kopylov
    • 1
  • B. A. Loginov
    • 2
  • R. R. Ismagilov
    • 1
  • A. N. Obraztsov
    • 1
  1. 1.Physics DepartmentMoscow State UniversityMoscowRussia
  2. 2.Moscow State Institute of Electronic EngineeringZelenograd, MoscowRussia

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