Single-crystal diamond probes for atomic-force microscopy
The results of investigations aimed at the development and testing of diamond probes for scanning atomic-force microscopy are presented. Plasmochemical deposition of diamond polycrystalline films and selective thermal oxidation were used to manufacture diamond probes. The obtained single-crystal diamond pyramidal tips of micron size had a radius of curvature of 2–20 nm at the top. The diamond tips were attached to a cantilever with an epoxy adhesive and then tested as probes in scanning atomic-force microscopy. Tests have shown that the manufactured diamond probes have appreciable advantages over conventional probes.
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