Advertisement

High Energy Chemistry

, Volume 52, Issue 5, pp 419–422 | Cite as

Radiation Stability of Copper Films under Irradiation with He2+ Ions

  • M. E. Kaliekperov
  • A. L. Kozlovskii
  • M. V. Zdorovets
  • D. I. Shlimas
Radiation Chemistry

Abstract

The effect of irradiation of copper films with low-energy He2+ ions on their structural properties has been studied. The surface morphology and structural properties of the samples before and after irradiation have been examined by scanning electron microscopy, energy dispersive analysis, and X-ray diffraction. Bombardment of the initial samples with He2+ ions at a fluence of 1 × 1016ion/cm2 alters the surface morphology of copper films and leads to the formation of nanoscale inclusions of hexagonal shape. An increase in the fluence to 1 × 1017 ion/cm2 and higher results in the formation of cracks and amorphous oxide inclusions on the sample surface.

Keywords

copper films radiation annealing of defects ionizing radiation structural properties 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Liu, X., et al., J. Mater. Chem. C, 2014, vol. 2, no. 44, p. 9536.CrossRefGoogle Scholar
  2. 2.
    Hong, M., et al., Nucl. Instrum. Methods Phys. Res., Sect. B, 2015, vol. 342, p.137.CrossRefGoogle Scholar
  3. 3.
    Hong, M., et al., Appl. Phys. Lett., 2012, vol. 101, no. (15), p. 153117.CrossRefGoogle Scholar
  4. 4.
    Kim, J.Y. and Stickney, J.L., J. Electroanal. Chem., 2008, vol. 621, no. 2, p.205.CrossRefGoogle Scholar
  5. 5.
    Huang, C., et al., Physica B (Amsterdam), 2014, vol. 438, p.17.CrossRefGoogle Scholar
  6. 6.
    Gebregziabiher, D.K., et al., J. Cryst. Growth, 2010, vol. 312, no. 8, p. 1271.CrossRefGoogle Scholar
  7. 7.
    Kim, I., et al., J. Nucl. Mater., 2013, vol. 441, nos. 1–3, p.47.CrossRefGoogle Scholar
  8. 8.
    Hao, J., et al., J. Colloid Interface Sci., 2012, vol. 377, no. 1, p.51.CrossRefGoogle Scholar
  9. 9.
    Konstantinov, S.V., Komarov, F.F., Pilko, V.V., and Kukareko, V.A., High Temp. Mater. Process., 2014, vol. 18, nos. 1–2, p.135.CrossRefGoogle Scholar
  10. 10.
    Gan, Y. and Chen, J.K., Mech. Res. Commun., 2009, vol. 36, no. 7, p. 838.CrossRefGoogle Scholar

Copyright information

© Pleiades Publishing, Ltd. 2018

Authors and Affiliations

  • M. E. Kaliekperov
    • 1
  • A. L. Kozlovskii
    • 1
    • 2
  • M. V. Zdorovets
    • 1
    • 2
    • 3
  • D. I. Shlimas
    • 1
    • 2
  1. 1.Institute of Nuclear PhysicsAlmatyKazakhstan
  2. 2.Gumilyov Eurasian National UniversityAstanaKazakhstan
  3. 3.Ural State UniversityYekaterinburgRussia

Personalised recommendations