Electrostriction mechanism of microwave losses in a ferroelectric film and experimental confirmation
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- Vendik, O.G. & Rogachev, A.N. Tech. Phys. Lett. (1999) 25: 702. doi:10.1134/1.1262605
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The experimental confirmation of the existence of the electrostriction mechanism of microwave losses in a thin ferroelectric film is discussed. The results of simulation of the dielectric loss tangent due to the mechanism discussed for a planar capacitor with one gap are presented and compared with existing experimental data for an interdigital capacitor. The simulation results agree well with the experimental data. The small discrepancy with experiment could be due to inaccurate determination of the sound velocity in the ferroelectric film and to differences in the capacitor structures used in the simulation and in the experiment.