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Practical evaluation for long-term stability of thermal interface material

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References

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Authors and Affiliations

  1. Department of Mechanical Engineering, Chung-Hua University, Taiwan, Republic of China

    C. I. Chen

  2. Department of Advanced Assembly Technology Integration, Taiwan, Republic of China

    C. Y. Ni

  3. Modeling and Reliability Program, Taiwan Semiconductor Manufacturing Company, Taiwan, Republic of China

    H. Y. Pan

  4. Department of Mechanical Engineering, National Chung Cheng University, Taiwan, Republic of China

    C. M. Chang & D. S. Liu

Authors
  1. C. I. Chen
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  2. C. Y. Ni
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  3. H. Y. Pan
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  4. C. M. Chang
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  5. D. S. Liu
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Correspondence to C. I. Chen.

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Chen, C.I., Ni, C.Y., Pan, H.Y. et al. Practical evaluation for long-term stability of thermal interface material. Exp Tech 33, 28–32 (2009). https://doi.org/10.1111/j.1747-1567.2008.00343.x

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  • DOI: https://doi.org/10.1111/j.1747-1567.2008.00343.x

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