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Chao, Y.C., Liu, D.S. Gold wire and solder joint microforce testing using microforce tester. Exp Tech 27, 37–40 (2003). https://doi.org/10.1111/j.1747-1567.2003.tb00128.x
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DOI: https://doi.org/10.1111/j.1747-1567.2003.tb00128.x