Skip to main content
Log in

Gold wire and solder joint microforce testing using microforce tester

  • Techniques
  • Published:
Experimental Techniques Aims and scope Submit manuscript

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

References

  1. Lau, J.H., Chip on Board Technologies for Multichip Modulus, Van Nostrand Reinhold, (1994).

  2. Concoulas, A., Hot Work Ultrasonic Bonding—A Method of Facilitating Metal Flow by Restoration Process, 20th IEEE Electronic Component Conf., 549–556, 1970.

  3. Harman, G.G., Wire Bonding in Microelectronics: Materials, Processes Reliability and Yield, 2nd Edition, McGraw-Hill, (1997).

  4. Tay A.A.O., Seah B.C., and Ong S.H., Finite Element Simulation of Wire Looping During Wirebonding, Proceeding of Advances in Electronic Packaging, ASME, 1997.

  5. Liu D.S., Chao Y.C., Wang C.H., Study of Wire Bonding Looping Formation in the Electronic Packaging Process Using the Three Dimensional Finite Element Method, Finite Element in Analysis and Design, accepted.

  6. Solomon H.D., Strain-Life Behavior in 60/40 Solder, Journal of Electronic Package, 111 (2), 75–82 (1989).

    Article  Google Scholar 

  7. Summers T.S.E., Morris J.W., Isothermal Fatigue Behavior of Sn-Pb Solder Joints, Journal of Electronic Package, 112 (2), 94–99 (1990).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Chao, Y.C., Liu, D.S. Gold wire and solder joint microforce testing using microforce tester. Exp Tech 27, 37–40 (2003). https://doi.org/10.1111/j.1747-1567.2003.tb00128.x

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1111/j.1747-1567.2003.tb00128.x

Navigation