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Evaluation of white light Fabry-Perót interferometry fiber-optic gages for small strains

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References

  1. Dally, J.W., Riley, W.F., and McConnell, K.G., “Instrumentation for Engineering Measurements,” Second Edition, John Wiley & Sons, Inc., 1993.

  2. Trouchet, D. et al., “Prototype Industrial Multi-Parameter F. O. Sensor Using White Light Interferometry,” Springer Proceedings in Physics, Vol. 44, 1989, pp. 227–233.

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  4. FISO Technologies, Inc., “Fiber Optic Strain Gages,” Application Note, FISO Technologies, Inc., 2014 Jean-Talon N., Suite 125, Sainte-Foy (Quebec) Canada G1N–4N6.

  5. National Instruments, Austin, Texas, USA.

  6. Hare, David A., and Moore, Thomas C., “Characteristics of Extrinsic Fabry-Perot Interferometric (EFPI) Fiber-Optic Strain Gages,” NASA/TP-2000-210639, December 2000.

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  8. Luna Innovations, Blacksburg, VA, USA.

  9. Measurement Group, Inc., Raleigh, NC, USA.

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Authors and Affiliations

  1. NASA Stennis Space Center, MS., USA

    F. Figueroa & W. St. Cyr

  2. Lockheed Martin Space Organization, Stennis Space Center, MS., USA

    D. Van Dyke, G. McVay & M. Mitchell

Authors
  1. F. Figueroa
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  2. W. St. Cyr
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  3. D. Van Dyke
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  4. G. McVay
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  5. M. Mitchell
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Figueroa, F., St. Cyr, W., Van Dyke, D. et al. Evaluation of white light Fabry-Perót interferometry fiber-optic gages for small strains. Exp Tech 27, 31–36 (2003). https://doi.org/10.1111/j.1747-1567.2003.tb00120.x

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  • DOI: https://doi.org/10.1111/j.1747-1567.2003.tb00120.x

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