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Cavatorta, M.P. The use of ellipsometry for surface film characterization in friction and wear phenomena. Exp Tech 25, 30–32 (2001). https://doi.org/10.1111/j.1747-1567.2001.tb00022.x
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DOI: https://doi.org/10.1111/j.1747-1567.2001.tb00022.x