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Editor’s note: This is a continuation of the installment featured in the March/April issue of ET. We are pleased to feature “Strain Gages — Back to Basics,” a series on strain gages, thanks to veteran SEM member, Peter K. Stein. If you have any comments about the series, or questions for Pete to address in this series, please contact me at pat@sem1.com. PD
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Stein, P.K. Back to basics. Exp Tech 24, 15–16 (2000). https://doi.org/10.1111/j.1747-1567.2000.tb00904.x
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DOI: https://doi.org/10.1111/j.1747-1567.2000.tb00904.x