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Editor’s Note: This is the third in a series of Feature articles prepared by Mark French, Chair of SEM’s Modal Analysis / Dynamic Systems Technical Division. Please contact SEM if you have any questions or comments regarding this, or any other, ET article. PB
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French, M., Jay, M. Instrumentation and data processing for automotive NVH testing. Exp Tech 22, 43–44 (1998). https://doi.org/10.1111/j.1747-1567.1998.tb02301.x
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DOI: https://doi.org/10.1111/j.1747-1567.1998.tb02301.x