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Real-time phase imaging for nondestructive testing

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References

  1. J. Wang and I. Grant, “Electronic speckle interferometry, phase-mapping, and nondestructive testing techniques applied to real-time thermal loading,” Appl. Opt. 34, 3620–3627 (1995).

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  2. K. Creath, “Phase-shiftings peckle interferometry,” Appl. Opt. 24, 3053–3058 (1985).

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  3. K.A. Stetson and W.R. Brohinsky, “Electro-optic holography and its application to hologram interferometry,” Appl. Opt. 24, 3631–3637 (1985).

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Authors and Affiliations

  1. Karl Stetson Associates, Coventry, CT, USA

    K. A. Stetson (SEM Member, owner)

  2. Recognition Technology, Inc., Framingham, MA, USA

    J. Wahid

Authors
  1. K. A. Stetson
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  2. J. Wahid
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Stetson, K.A., Wahid, J. Real-time phase imaging for nondestructive testing. Exp Tech 22, 15–17 (1998). https://doi.org/10.1111/j.1747-1567.1998.tb01278.x

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  • DOI: https://doi.org/10.1111/j.1747-1567.1998.tb01278.x

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