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Correction for system compliance during point-loading of thin brittle films

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Authors and Affiliations

  1. Optical Imaging Systems, Inc., Northville, MI, USA

    C. Liu (Engineer)

  2. Michigan State University, East Lansing, MI, USA

    E. D. Case (Associate Professor)

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  1. C. Liu
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  2. E. D. Case
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Liu, C., Case, E.D. Correction for system compliance during point-loading of thin brittle films. Exp Tech 21, 28–31 (1997). https://doi.org/10.1111/j.1747-1567.1997.tb00506.x

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