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Stress mapping: A new way of tackling the characterization of residual stresses

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Authors and Affiliations

  1. Proto Manufacturing Ltd., Oldcastle, Ontario, Canada

    J. Pineault (SEM Member, Physicist) & M. Brauss (SEM Member, R&D Manager)

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  1. J. Pineault
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  2. M. Brauss
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Pineault, J., Brauss, M. Stress mapping: A new way of tackling the characterization of residual stresses. Exp Tech 19, 17–18 (1995). https://doi.org/10.1111/j.1747-1567.1995.tb00842.x

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  • DOI: https://doi.org/10.1111/j.1747-1567.1995.tb00842.x

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