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Haake, S.J., Wang, Z.F. & Patterson, E.A. Evaluation of full field automated photoelastic analysis based on phase stepping. Exp Tech 17, 19–25 (1993). https://doi.org/10.1111/j.1747-1567.1993.tb00785.x
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DOI: https://doi.org/10.1111/j.1747-1567.1993.tb00785.x