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Material testing by computer aided speckle interferometry

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References

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Wang, Y.V., Chen, D.J. & Chiang, F.P. Material testing by computer aided speckle interferometry. Exp Tech 17, 30–32 (1993). https://doi.org/10.1111/j.1747-1567.1993.tb00772.x

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  • DOI: https://doi.org/10.1111/j.1747-1567.1993.tb00772.x

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