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High-temperature, high-sensitivity Moiré interferometry

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References

  1. Guild, J., “The Interference Systems of Crossed Diffraction Gratings; Theory of Moiré Fringes,” Oxford at the Clarendon Press, (1956).

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  2. Czarnek, R., Lee, J. and Lin, S.Y., “Testing of Composite Materials at Elevated Temperatures Using Moiré Interferometry,” Proceedings of the International Conference on Composite Materials (ICCM/8), Paper number 36-O, Honolulu, Hawaii, (July 1991).

  3. Kang, B.S.-J., Wang F.X. and Liu, Q.K., “High Temperature Moiré Interferometry for Use to 550°C,” Proceedings of the 1990 SEM Fall Conference, 457–464.

  4. Czarnek, R., “High-Sensitivity Moiré Interferometry with a Compact Achromatic Interferometer,” Optics and Lasers in Engineering, 13, (2) 99–115 (1990).

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  5. Czarnek, R., Lee, J. and Rantis, T., “Moiré Interferometry with Enhanced Resolution;” EXPERIMENTAL TECHNIQUES, 14, (4) 24–28, (July/August 1990).

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  6. Morton, J. and Czarnek, R., “Dynamic Response of Advanced Material Systems: A Photomechanics Approach,” Quarterly Report, DARPA/ONR project number N0014-88-K-0741, (June-1989).

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Authors and Affiliations

  1. Concurrent Technologies Corporation, Johnstown, PA, USA

    R. Czarnek (SEM Member, Principal Engineer) & S. Y. Lin (SEM Member, Engineer)

  2. Virginia Polytechnic Institute and State University, Blacksburg, USA

    J. J. Wu (SEM Member, Research Associate)

Authors
  1. R. Czarnek
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  2. J. J. Wu
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  3. S. Y. Lin
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  4. J. Lee
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Czarnek, R., Wu, J.J., Lin, S.Y. et al. High-temperature, high-sensitivity Moiré interferometry. Exp Tech 17, 29–33 (1993). https://doi.org/10.1111/j.1747-1567.1993.tb00749.x

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  • DOI: https://doi.org/10.1111/j.1747-1567.1993.tb00749.x

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