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A resistance strain gage with repeatable apparent strain to 800°C

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References

  1. Hulse, C.O., Bailey, R.S. and Lemkey, F.D., “High Temperature Static Strain Gage Alloy Development Program,” NASA Report No. CR-174833 (1985).

  2. Englund, D.R., “The Dual Element Method of Strain Gage Temperature Compensation,” The Fourth Annual Hostile Environments and High Temperature Measurements Conference Proceedings, SEM, 40–43 (1987).

  3. Lei, Jih-Fen, “Development and Characterization of PdCr Temperature-Compensated Wire Resistance Strain Gage,” NASA Report No. CR-185153 (1989).

  4. Hobart, H.F. and Will, H.A., “The Lewis Strain Gage Laboratory—Status and Plans,” NASA Conference Publication No. 2405 (1985).

  5. Hobart, H.F., “Evaluation Results of the 700°C Chinese Strain Gages,” NASA Technical Memorandum 86973 (1985).

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Authors and Affiliations

  1. Sverdrup Technology, Inc., NASA Lewis Research Center Group, Cleveland, OH, USA

    J.-F. Lei (SEM Member)

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  1. J.-F. Lei
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Lei, JF. A resistance strain gage with repeatable apparent strain to 800°C. Exp Tech 15, 23–27 (1991). https://doi.org/10.1111/j.1747-1567.1991.tb01194.x

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  • DOI: https://doi.org/10.1111/j.1747-1567.1991.tb01194.x

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