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Van Nhieu, M.T., Schafer, M.E., Lewin, P.A. et al. Abstracts of Interest. Exp Tech 13, 14–15 (1989). https://doi.org/10.1111/j.1747-1567.1989.tb01443.x
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DOI: https://doi.org/10.1111/j.1747-1567.1989.tb01443.x