Skip to main content
Log in

Application of a Peak-valley Detector for Secant Stiffness Measurements

  • Published:
Experimental Techniques Aims and scope Submit manuscript

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

References

  1. Horowitz P. and Hill, W., “The Art oi Electronics,” Cambridge Univ. Press, New York (1980)

    Google Scholar 

  2. Sheingold, D.H. ed. “Nonlinear Circuits Handbook.” Analog Devices, Inc., Norwood. MA (1976).

    Google Scholar 

  3. “1982 Linear Databook.” Nat. Semiconductor Corp., Santa Clara, CA (1982).

  4. “Data Acquisition Components and Subsystems.” Analog Devices Inc., Norwood. MA (1980)

  5. “1981 CMOS Data Book.” Nat Semiconductor Corp., Santa Clara, CA (1981).

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Stiffler, R. Application of a Peak-valley Detector for Secant Stiffness Measurements. Exp Tech 8, 17–20 (1984). https://doi.org/10.1111/j.1747-1567.1984.tb01822.x

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1111/j.1747-1567.1984.tb01822.x

Navigation