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The metrology behind trade

  • Measure for Measure
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The impact of legal metrology often remains unnoticed in our everyday lives. Pavel Klenovsky, Marc Wouters and Wilfried de Waal instruct us in trade and legal regulations.

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Authors and Affiliations

  1. WELMEC, Brunswick, Germany

    Pavel Klenovsky, Marc Wouters & Wilfried de Waal

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  1. Pavel Klenovsky
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  2. Marc Wouters
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  3. Wilfried de Waal
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Correspondence to Pavel Klenovsky.

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Klenovsky, P., Wouters, M. & de Waal, W. The metrology behind trade. Nat. Phys. 18, 842 (2022). https://doi.org/10.1038/s41567-022-01670-4

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  • DOI: https://doi.org/10.1038/s41567-022-01670-4

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