Fig. 3: Ellipse calibration of crystal and amorphous samples.
From: A Unified preprocessing framework for high-throughput diffraction pattern analysis
a Diffraction patterns of both samples before and after ellipse calibration, showing improved ring circularity. (left: Li6PS5Cl, right: Cu-Zr). b Polar coordinate transforms before and after calibration. c Radial integrals as a function of radial distance calculated from the uncalibrated (blue) and calibrated (orange) patterns. The intensity values were clipped at the 99th percentile to suppress the dominance of the central beam and emphasize higher-order diffraction features. d Radial standard deviation calculated from the uncalibrated (blue) and calibrated (orange) patterns. e Errors between the predicted and ground-truth sine and cosine values of elliptical distortion on the test data.