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Oxide electronics

Transistors pick up steam

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High annealing temperatures have limited the technological potential of solution-processed metal oxide semiconductors. It is now shown that high-quality films can be formed below 250 °C using precursors that are hydrolysed on-chip.

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Figure 1: An ideal thin-film transistor.
Figure 2: The electrical characteristics of an unstable TFT.

References

  1. Dehuff, N. L. et al. J. Appl. Phys. 97, 064505 (2005).

    Article  Google Scholar 

  2. Mo, Y. G. et al. SID 10 Digest 41, 1037–1040 (2010).

    Article  CAS  Google Scholar 

  3. Banger, K. K. et al. Nature Mater. 10, 45–50 (2011).

    Article  CAS  Google Scholar 

  4. Taylor, M. P. et al. Adv. Funct. Mater. 18, 3169 (2008).

    Article  CAS  Google Scholar 

  5. Hoffman, R., Emery, T., Yeh, B., Koch, T. & Jackson, W. SID 09 Digest 40, 288–291 (2009).

    Article  CAS  Google Scholar 

  6. Choi, C. G., Seo, S. J. & Bae, B. S. Electrochem. Solid State Lett. 11, H7–H9 (2008).

    Article  CAS  Google Scholar 

  7. Norris, B. J., Anderson, J., Wager, J. F. & Keszler, D. A. J. Phys. D 36, L105 (2003).

  8. Heo, J.-s. et al. SID 10 Digest 41, 241–244 (2010).

    Article  CAS  Google Scholar 

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Keszler, D. Transistors pick up steam. Nature Mater 10, 9–10 (2011). https://doi.org/10.1038/nmat2932

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