Skip to main content
Log in

Environmental SEM premières

  • Product Review
  • Published:

From Nature

View current issue Submit your manuscript

The environmental scanning electron microscope (SEM) eliminates the high-vacuum requirement of conventional SEM, allowing the analysis of unprepared, wet samples.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

References

  1. Postek, M.T. Howard, K.S., Johnson, A.H. & McMichael, K.L. Scanning Electron Microscopy: A Student's Handbook, 115–238 (Ladd Research, Indiana, 1980).

    Google Scholar 

  2. Hayat, M.A. Fixation for Electron Microscopy 385–388 (Academic, New York, 1981).

    Google Scholar 

  3. Lane, W.C. Scanning Electron Microsc, 43–48 (1970).

    Google Scholar 

  4. Swift, J.A. & Brown, A.C. J. phys. Sci. Instrum. 3, 924 (1970).

    Article  ADS  CAS  Google Scholar 

  5. Danilatos, G.D. Adv. Electron. Electron Phys. 71, 109–250 (1988).

    Article  CAS  Google Scholar 

  6. Goldstein, J.I. et al. Scanning Electron Microscopy and X-ray Microanalysis 176–183 (Plenum, New York, 1984).

    Google Scholar 

  7. Danilatos, G.D. Micron and Microsc. Acta. 14, 307 (1983).

    Article  Google Scholar 

  8. Danilatos, G.D. Adv. Electron. Electron Phys. 77 (in the press).

  9. Peters, K.-R. Proc. 47th EMSA 78 (1989).

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Baumgarten, N. Environmental SEM premières. Nature 341, 81–82 (1989). https://doi.org/10.1038/341081a0

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1038/341081a0

  • Springer Nature Limited

This article is cited by

Navigation