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Physical Sciences: Charged Particle Track Registration in Amber

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Abstract

IONIZING charged particles can leave damage trails in certain dielectric solids which, in suitable conditions, can be chemically etched into visible, usually cone-shaped, tracks1–3. Such tracks have been widely studied in minerals, glasses, and synthetic polymers4, but damage tracks in natural resin solids such as amber have not previously been studied.

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Authors and Affiliations

  1. General Electric Research and Development Center, Schenectady, New York, 12301

    E. E. UZGIRIS & R. L. FLEISCHER

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  1. E. E. UZGIRIS
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  2. R. L. FLEISCHER
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UZGIRIS, E., FLEISCHER, R. Physical Sciences: Charged Particle Track Registration in Amber. Nature 234, 28–30 (1971). https://doi.org/10.1038/234028a0

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