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Effect of the Multiplicative Instrumental Error on X-Ray Measuring Instrument Characteristics

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Abstract

Mathematical relations between the multiplicative instrumental component of the measurement error in a tested parameter and the level of uctuations of characteristics of an electronic channel are obtained for certain forms of amplitude distributions and conditions of selecting pulses from a detector. It is shown theoretically that the instrumental error plays an important role in choosing the main and optimum parameters of the measurement tools, in particular, under increased detector loadings. Practical methods of taking into account and reducing significantly the instrumental error for particular situations are given with reference to the use of SBM-20 counters in gamma-absorption densimeters.

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Authors and Affiliations

  1. Introscopy Research Institute, Tomsk, Russia

    A. I. Bezuglov

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  1. A. I. Bezuglov
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Bezuglov, A.I. Effect of the Multiplicative Instrumental Error on X-Ray Measuring Instrument Characteristics. Russian Journal of Nondestructive Testing 39, 782–790 (2003). https://doi.org/10.1023/B:RUNT.0000020250.75093.3e

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  • DOI: https://doi.org/10.1023/B:RUNT.0000020250.75093.3e

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